Microscopes

TEM/STEM instruments

ElMic Lab
Aristotle University of Thessaloniki

JEOL JEM-F200 Multi-purpose UHR TEM/STEM

High-Resolution Scanning/Transmission Electron Microscopy (HRTEM/HRSTEM) 

Energy Dispersive X-ray Spectroscopy (EDX)  

Detection: 

  • EDX detector T-max 65 Oxford Instruments  
  • 9Mp CMOS GATAN Bottom camera 
  • 4Mp JEOL side camera 
  • High Angle Annular Dark Field ( HAADF Z-contrast imaging) 
  • Annular Bright Field (ABF)  
  • Annular Dark Field (ADF) imaging 

Source: Cold Field Emission Gun 

Beam Voltage: 200kV  

HRTEM point-to-point resolution: 0.19 nm 
HRSTEM point-to-point resolution: 0.14 nm 

Positioning: αtilt=±25°, βtilt=±25° 

National Centre for Scientific Research Demokritos

Thermo Fisher Scientific Talos F200i TEM

Conventional & High-Resolution Scanning / Transmission Electron Microscopy

Energy Dispersive X-ray Spectroscopy (EDX)

Detection: 

  • EDX Bruker 6|T Flash 100 mm2 (light elements sensitivity down to Be) 
  • 16Mp CETA CMOS camera
  • 4kx4k STEM imaging
  • Triple Thermo-Fisher 3 detectors system bright field (BF), annular dark field (DF1, DF2)
  • Fischione 3000 high angle annular dark field detector (HAADF)

Source: Field Emission Gun 

Beam Voltage: 200kV  

HRTEM point-to-point resolution: 0.25 nm
HRSTEM point-to-point resolution: 0.16 nm

Positioning: αtilt= 35°, βtilt= 30° 

Norwegian Centre for Transmission Electron Microscopy

FEI Titan G2 60-300

High-Resolution Scanning/Transmission Electron Microscopy (HRTEM/HRSTEM)

Energy Dispersive X-ray Spectroscopy (EDX) 

Electron Energy Loss Spectroscopy (EELS) In situ//in operando heating/cooling, gas, biasing experiments

Detection: 

  • Super-X EDS detector: 0.7 srad collection angle
  • 6 STEM detectors for BF, ABF, ADF and HAADF STEM imaging
  • Gatan GIF Quantum ER 965 with Ultrafast DualEELS spectrometer and Omega-q mapping module

Velox software package: simultaneous EDS and EELS mapping

In situ/in operando:

  • Protochips Atmosphere gas cell system: high spatial resolution S/TEM imaging, EELS and EDS in reactive gases and elevated temperature. Gases at pressures up to 1 atm, temperature up 1000 °C
  • Protochips Fusion Double tilt holder with MEMS-based E-chips for in-situ thermal and electrothermal TEM analysis. Heating up to 1200 °C at any rate up to 1000 ºC/ms
  • Gatan Double tilt heating holder, up to 850 °C
  • Gatan Double tilt liquid nitrogen cooling holder, -170 °C to 110 °C
  • Gatan inert transfer holder

Source: High brightness XFEG 

Beam Voltage: Aligned at 60, 200 and 300 kV

HRSTEM point-to-point resolution: 0.08 nm (DCOR Cs probe corrector)

Energy resolution: 0.2 eV (Wien-filter monochromator)

Positioning: αtilt=±30°, βtilt=±30°

TEM instruments

JEOL JEM 2011 UHR TEM

Conventional & High-Resolution Transmission Electron Microscopy

Detection: 

  • 20Mp CMOS camera XAROSA EmSis-Olympus

Source: Thermionic Gun LaB6 

Beam Voltage: 200kV

HRTEM point-to-point resolution: 0.19 nm

Positioning: αtilt= 12°, βtilt= 12°  

FEI CM20 TEM

Conventional & High-Resolution Transmission Electron Microscopy

Electron Energy Loss Spectroscopy (EELS)

Energy Dispersive X-ray Spectroscopy (EDX)  

Detection:

  • EDAX EDX system (light elements sensitivity down to B)  
  • 1Mp CCD camera with GIF
  • GATAN GIF200 imaging filter

Source: Thermionic Gun LaB6

Beam Voltage: 200kV

HRTEM point-to-point resolution: 0.27 nm

Positioning: αtilt= 45°, βtilt= 30°

JEOL JEM 1010 TEM

Conventional Transmission Electron Microscopy

Detection: 

  • GATAN Compact TV camera-Model 696

Source: Thermionic Gun W

Beam Voltage: 100kV

TEM point-to-point resolution: 0.4 nm

Positioning: αtilt= 45°, βtilt= 45°

JEOL JEM 2011 UHR TEM

Conventional & High-Resolution Transmission Electron Microscopy

Detection: 

  • 20Mp CMOS camera XAROSA EmSis-Olympus

Source: Thermionic Gun LaB6

Beam Voltage: 200kV  

HRTEM point-to-point resolution: 0.19 nm

Positioning: αtilt= 12°, βtilt= 12°

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